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NI News
July 21, 2009
Your Source for Measurement and Automation News, Events, and Developer Resources
 
 
In This Issue
 
 
Cut the Wires, Cut the Cost   Three Mil/Aero Test Trends
US 09 NI News July 21 Image 1   US 09 NI News July 21 Image 2
Reduce installation costs, save time, and eliminate wiring while solving new application problems using a wireless monitoring system.

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  Learn about three trends challenging the mil/aero industry and how major companies are addressing them with NI products.

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Developer Resources

Data Management Technology Basics
Learn about the NI technical data management technologies that can help you store, manage, and process your test data.
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11 Shocking Green Engineering Numbers
Discover 11 statistics that prove green engineering and affordable energy are the key technical challenges of the current times.
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Webcast: GPS Simulation Fundamentals
Learn the basic setup for GPS receiver testing and the pros and cons of using an NI GPS simulator versus a record-and- playback test solution.
View webcast »

Example Code: Teasing Homer Simpson
Download this example code to tease Homer Simpson by turning the mouse cursor into a doughnut that his eyes follow around the screen.
Download code »

 
 

New Products and Technologies

Video: Virtualization in the Engineering World
Watch Jim St. Leger of Intel Corporation explore the economic benefits of virtualization technology and how engineers can take advantage of it while maintaining real-time performance.
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Advanced Data Management Capabilities with DIAdem 11.1
Learn how you can use NI DIAdem 11.1 to add advanced data visualization and data management features to high-volume applications and large group development projects.
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Custom Data Acquisition with NI R Series DAQ
Exceed the capabilities of traditional data acquisition hardware with new NI R Series multifunction RIO data acquisition (DAQ)devices.
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F-RAM Memory Validation and Debugging with NI PXI and Modular Instruments
See how engineers at Ramtron International created a flexible, cost-effective ferroelectric RAM (F-RAM) test system as an alternative to existing automated test equipment.
Read case study »

 
 

Events and Training

NIWeek 2009 Is Only Two Weeks Away
Time is running out to register for the National Instruments worldwide graphical system design conference, August 4-6, in Austin, Texas. Learn more about the conference, register, and create your personalized list of sessions now.
Register now »

Evaluation Quiz: Test Your LabVIEW Skills
Find out which NI training option is best for you by assessing your skills with the LabVIEW evaluation quiz.
Take quiz »


 
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